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Measurement System×システムロード - List of Manufacturers, Suppliers, Companies and Products

Measurement System Product List

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Polarization Characteristic Measurement System 'PP8'

Polarization Characteristic Measurement System 'PP8'

Automatic evaluation of polarized spectra! A polarimetric measurement system capable of real-time display.

The "PP8" is a polarization characteristic measurement system that can automatically evaluate polarization degree, polarization spectrum, transmittance, color characteristics, and more, with real-time display capabilities. It supports various options and custom specifications, including fixtures tailored to samples and UV measurements for UV-A and UV-B. With comprehensive software, it supports the development and evaluation of LED modules, devices, and more. 【Features】 ■ Automatically evaluates polarization spectrum and color characteristics ■ Real-time display capability ■ Supports various options and custom specifications ■ Assists in the development and evaluation of LED modules, devices, etc. *For more details, please refer to the PDF materials or feel free to contact us.

  • Analytical Equipment and Devices

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Lighting distribution measurement system 'RR8-LED-2000/12000'

Lighting distribution measurement system 'RR8-LED-2000/12000'

Calibration using the customer's standard light source is also possible! Measurement system compliant with JIS C8105-5 photometric measurement method.

The "RR8-LED-2000/12000" can automatically evaluate the light distribution characteristics, total luminous flux, chromaticity characteristics, and electrical characteristics of LED lighting, various light sources, planar light emission, and spotlights. The Topcon spectroradiometer is JCSS calibrated, and the calculations comply with JIS standards. Additionally, by removing the illuminance adapter, it is possible to measure brightness over a wide dynamic range (0.0005 to 5,000,000 cd/m²). 【Features】 ■ Real-time display capability ■ Calibration using the customer's standard light source is also possible ■ Complies with JIS C8105-5 light distribution measurement methods ■ Capable of outputting IES light distribution data compatible with lighting design software ■ Supports various options and custom specifications *For more details, please refer to the PDF document or feel free to contact us.

  • Analytical Equipment and Devices

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Multispectral Imaging Measurement System 'OD4-8'

Multispectral Imaging Measurement System 'OD4-8'

For evaluating dry test chips! It is possible to measure the reaction distribution within the cell.

The "OD4-8" is a measurement system capable of obtaining fundamental data necessary for analysis methods under uneven reactions and the development of algorithms to eliminate the effects of entrained bubbles and debris. The software can determine the time-dependent changes in absorbance at each wavelength from five-wavelength image information. Additionally, since all data is saved as images, you can change the measurement range after the measurement and analyze freely. 【Features】 ■ For evaluating dry inspection chips ■ Capable of measuring the reaction distribution within the cell ■ Can cancel external light and noise due to the chopper method ■ Can calculate optical density from the transmittance of the sample relative to the reference ■ Continuous measurement can be performed at arbitrary intervals *For more details, please refer to the PDF document or feel free to contact us.

  • Other measurement, recording and measuring instruments

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"Custom specifications available" Non-contact film thickness gauge 'FF8'

"Custom specifications available" Non-contact film thickness gauge 'FF8'

The measurement data can be saved to a file, and re-analysis is possible later with a non-contact film thickness measurement system!

The "FF8" is a non-contact film thickness measurement system that measures the reflectance of samples (interference waveform) and analyzes film thickness values using FFT (Fast Fourier Transform) and other methods. In addition to film thickness measurement, it can also measure the thickness and refractive index of films and glass. With optional features, it is capable of multilayer film analysis, curve fitting methods, microscopy, mapping measurements, color measurement, and component concentration analysis. It is also possible to create continuous measurement functions, traverse mechanisms, and data communication functions, allowing it to be used for inline film thickness measurement. 【Features】 ■ Measures the reflectance of samples and analyzes film thickness values using FFT and other methods ■ Can measure the thickness and refractive index of films and glass in addition to film thickness ■ Measurement data can be saved as files, allowing for re-analysis later ■ Can be used for inline film thickness measurement ■ Custom specifications can also be accommodated *For more details, please refer to the PDF document or feel free to contact us.

  • Optical Measuring Instruments

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Integrating Sphere LED Measurement System 'LL8'

Integrating Sphere LED Measurement System 'LL8'

Work that takes several days can be automatically measured in just a few hours! We support the development and evaluation of LED devices.

The "LL8" is an LED integrating sphere measurement system that can automatically evaluate optical, temperature, and electrical characteristics, with real-time display capabilities. It uses a standard calibration light source compliant with U.S. NIST, and the calculations adhere to JIS standards. With comprehensive software that includes features like graph overlay and statistical processing, it supports the development and evaluation of LED devices. 【Features】 ■ Automatic evaluation of optical, temperature, and electrical characteristics ■ Real-time display capability ■ Uses a standard calibration light source compliant with U.S. NIST ■ Calculations adhere to JIS standards ■ Supports various options and custom specifications *For more details, please refer to the PDF document or feel free to contact us.

  • Analytical Equipment and Devices

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LED Lighting and Quantity Measurement System 'SR10-LT'

LED Lighting and Quantity Measurement System 'SR10-LT'

A system for LED lighting and quantity measurement that allows for automatic measurement inline, capable of registering the shapes of various types!

The "SR10-LT" is an LED lighting and quantity measurement system that can evaluate the number of LEDs and their brightness on a circuit board, with real-time display capabilities. In addition to measuring the number of LEDs on the circuit board without lighting them, it also allows for automatic measurement inline. It supports various options and custom specifications, including LED position detection and shape detection through image recognition, as well as determining the presence of parts such as connectors. 【Features】 ■ Real-time display capability ■ Ability to measure the number of LEDs on the circuit board without lighting them ■ Automatic measurement inline ■ Ability to register shapes of various types through teaching ■ Supports various options and custom specifications *For more details, please refer to the PDF document or feel free to contact us.

  • Analytical Equipment and Devices

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Integrating Sphere Measurement System 'LL8-UV-VIS-NIR'

Integrating Sphere Measurement System 'LL8-UV-VIS-NIR'

Achieving high-precision light measurement for LED optical characteristic evaluation! Calibration with the customer's standard light source is also possible.

The "LL8-UV-VIS-NIR" is a system that automatically controls an integrating sphere, spectrometer, power supply, etc., to efficiently develop and evaluate LEDs, measuring their optical, electrical, and thermal characteristics. The standard calibration light source complies with the U.S. NIST, and the calculations adhere to JIS standards. Calibration with the customer's standard light source is also possible. Additionally, the system supports the development and evaluation of LED devices with comprehensive software that includes features such as graph overlay and statistical processing. 【Features】 ■ Achieves high-precision optical measurement for LED optical characteristic evaluation ■ Automatically controls integrating sphere, spectrometer, power supply, etc., for efficient LED development and evaluation ■ Capable of measuring the optical, electrical, and thermal characteristics of LEDs ■ Supports the development and evaluation of LED devices with comprehensive software ■ Accommodates various options and custom specifications *For more details, please refer to the PDF materials or feel free to contact us.

  • Other measurement, recording and measuring instruments

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Integral sphere quantum efficiency measurement system 'LL8-UV-VIS-NIR'

Integral sphere quantum efficiency measurement system 'LL8-UV-VIS-NIR'

Achieving high-precision optical measurements such as quantum efficiency measurement and LED optical characteristic evaluation! Supports various options and custom specifications.

The "LL8-UV-VIS-NIR" is an integrating sphere quantum efficiency measurement system that uses an excitation light source to measure external quantum efficiency, internal quantum efficiency, excitation wavelength dependence, excitation spectrum, and emission spectrum. To efficiently conduct LED development and evaluation, it automatically controls the integrating sphere, spectrometer, power supply, and other components. It measures the optical, electrical, and thermal characteristics of LEDs. Furthermore, the standard calibration light source complies with US NIST standards, and the calculations adhere to JIS standards. 【Features】 ■ Achieves high-precision optical measurements for quantum efficiency measurement and LED optical characteristic evaluation. ■ Automatically controls the integrating sphere, spectrometer, power supply, and other components for efficient LED development and evaluation. ■ Measures the optical, electrical, and thermal characteristics of LEDs. ■ Calibration is also possible with the customer's standard light source. ■ Supports the development and evaluation of LED devices with comprehensive software. *For more details, please refer to the PDF document or feel free to contact us.

  • Other measurement, recording and measuring instruments

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Temperature Characteristic Measurement System "LL8-HC"

Temperature Characteristic Measurement System "LL8-HC"

Using a constant temperature bath for temperature control! It is possible to measure a wide range of temperature characteristics from -60℃ to +150℃.

The "LL8-HC" is a temperature characteristic measurement system that can measure optical, temperature, and electrical characteristics with a single unit by automatically controlling the spectrometer, power supply, and constant temperature bath. It can automatically change current, voltage, and temperature while measuring optical and electrical characteristics in real-time under those conditions. Additionally, it is capable of performing time variation measurements at fixed intervals and repeated measurements for a specified number of times. 【Features】 ■ Current and voltage can be driven in DC and pulse modes ■ Reverse bias measurements are also possible ■ Measurement results can be saved, and various analyses can be performed using the analysis processing function ■ Analyzed results can be printed, saved as CSV, or copied to the clipboard ■ The software features a user-friendly display entirely in Japanese *For more details, please refer to the PDF document or feel free to contact us.

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"Custom specifications available" Non-contact film thickness measurement system 'FF8'

"Custom specifications available" Non-contact film thickness measurement system 'FF8'

The measurement data can be saved to a file, and re-analysis is possible later with a non-contact film thickness measurement system!

The "FF8" is a non-contact film thickness measurement system that measures the reflectance of samples (interference waveforms) and analyzes film thickness values using FFT (Fast Fourier Transform) and other methods. In addition to film thickness measurement, it can also measure the thickness and refractive index of films and glass. With optional features, it is capable of multi-layer film analysis, curve fitting, microscopy, mapping measurements, color measurement, and component concentration analysis. It is also possible to manufacture continuous measurement functions, traverse mechanisms, and data communication functions, allowing it to be used for inline film thickness measurement. 【Features】 ■ Measures the reflectance of samples and analyzes film thickness values using FFT and other methods ■ Can measure the thickness and refractive index of films and glass in addition to film thickness ■ Measurement data can be saved as files, allowing for re-analysis later ■ Can be used for inline film thickness measurement ■ Custom specifications can also be accommodated *For more details, please refer to the PDF document or feel free to contact us.

  • Optical Measuring Instruments

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